What is CMOS latch-up problem?

What is CMOS latch-up problem?

Latch-Up is a condition where a low impedance path is created between a supply pin and ground. The Latch-Up condition typically requires a power cycle to eliminate the low impedance path. CMOS and BiCMOS circuits use NMOS and PMOS transistors to create the circuit functions.

What is CMOS latch-up?

What is Latchup: Latchup refers to short circuit formed between power and ground rails in an IC leading to high current and damage to the IC. Speaking about CMOS transistors, latch up is the phenomenon of low impedance path between power rail and ground rail due to interaction between parasitic pnp and npn transistors.

What is latch-up problem how do you prevent latch-up problem in CMOS?

Preventing latch-up It is possible to design chips to be resistant to latch-up by adding a layer of insulating oxide (called a trench) that surrounds both the NMOS and the PMOS transistors. This breaks the parasitic silicon-controlled rectifier (SCR) structure between these transistors.

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What is latch-up error?

Simply defined, Latch-Up is a functional chip failure associated with excessive current going through the chip, caused by weak circuit design. In some cases Latch-Up can be a temporary condition that can be resolved by power cycle, but unfortunately it can also cause a fatal chip failure.

What is latch-up test?

We perform latch-up testing to determine the robustness of the device to latch-up, much like we perform ESD testing to determine the robustness of the device to ESD. Latch-up testing can be accomplished with a latch-up test. system. These systems are sometimes configured to do both ESD. and latch-up.

Which among the following suffer from latch-up issue?

Explanation: BiCMOS process produces circuits that are less likely to suffer from latch-up problems where as CMOS circuits are very highly prone to latch-up problems. 7.

Which is the main factor for reducing the latch-up effect?

Explanation: One of the main factors in reducing the latch-up effect is reduced n-well resistance Rw. Reduction in Rw means that a larger lateral current is necessary to invite latch-up and higher value of holding current is also required.

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What is latch-up in op amp?

In JFET-input operational amplifiers, latch-up may occur if the common-mode input voltage approaches too closely to the negative power supply rail voltage. On the TL082 op-amp, for example, this occurs when the common-mode input voltage comes within about 0.7 volts of the negative power supply rail voltage.

What can be used to reduce latch-up effect?

guard rings
What can be introduced to reduce the latch-up effect? Solution: The introduction of guard rings can reduce the effect of latch-up problem. Guard rings are diffusions which decouple the parasitic bipolar transistors.

What is latch-up in CMOS?

Latch-up is defined as the generation of a low-impedance path in CMOS chips between the power supply (V DD) and the ground (GND) due to the interaction of parasitic PNP and NPN bipolar junction transistors (BJTs).

What is latch-up in chip design?

Simply defined, Latch-Up is a functional chip failure associated with excessive current going through the chip, caused by weak circuit design. In some cases Latch-Up can be a temporary condition that can be resolved by power cycle, but unfortunately it can also cause a fatal chip failure. CMOS Latch-Up.

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How to prevent the latch-up issue?

Following two factors are important for the latch-up issue. Figure-1 shows the parasitic BJT formation which causes latch-up. n-well and p-substrate resistance can be reduced by increasing the doping but it will degrade the device performance drastically. But we can cut down the gains of parasitic BJT ( β) and prevent the latch-up issue.

What is latch-up in microcontroller?

Answer Wiki. Simply defined, Latch-Up is a functional chip failure associated with excessive current going through the chip, caused by weak circuit design. In some cases Latch-Up can be a temporary condition that can be resolved by power cycle, but unfortunately it can also cause a fatal chip failure.